Tester | |||
Brand | Model | Application | Special Features |
Teradyne | J750 J750Ex J750ExHD |
Logic/Mixed Signal | DPS/HDVIS/HDDPS MTO/DSMTO CTO/HDCTO MSO APMU |
Teradyne | IFlex | Logic/Mixed-signal/SoC/SiP | BBAC/VHFAC |
Teradyne |
Uitra-Flex
UltraFLEXplus
|
Logic/Mixed Signal/RFSoC | TurboAC |
Teradyne | ETS-88 | Power IC Logic |
Dual Test Head APU12, SPU112 |
Teradyne |
Magnum
Magnum_V_XV
|
eMMC/Toggle NAND/
Legacy NAND/ONFI FLASH/ MCP/eMCP/LPDDR2/LPDDR3 |
Site Assembly board |
AccoTEST | STS8200 | Analog/Linear/PMIC/Power |
AC source/ Meter with
AWG/Digitizer
|
Advantest | V93000 PS800 PS1600 |
Logic/Mixed Signal
|
C400e/P600/PS
TIA (Time Interval Analyzer) AWG (Analogue Wave Generator) |
Advantest | T2000 T2000EPP |
SOC | ALPG |
Advantest | T5335P | Memory | Flash Option MRA2 & MRA3 |
Advantest | T6371 | LCD driver IC |
LCD |
Advantest | Versatest V330X |
Flash |
256K & 1M Vector Memory 64 I/O
Per Site |
Chroma | 3380P | Logic/Mixed Signal | AW12/MXREF/HDADDA |
Yokogawa | TS670 | LCD driver IC |
LCD |
TRI | TR6850 | Power IC Logic |
Light Source AC32 |
Credence | Kalos | Flash |
16 Sites
Per Tester |
Laser Repair | ||
9350(8")/ESI | ||
9830(12")/ESI | ||
M435(12")/GSI |
Prober | |
90A, UF200, UF300, UF3000, UF3000EXe/TSK | |
P8, P12, Precio/TEL | |
OPUSⅡ, OPUSⅢ, OPUSⅢSH/SEMICS |
Probe Card Analyzer | ||
PRVX Ⅲ, PRVX Ⅳ/Onto Rudolph | ||
VMZ-R4540/VMZ-R6560/NIKON |